The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2014
Filed:
Nov. 16, 2009
Thomas Buelow, Grosshansdorf, DE;
Rafael Wiemker, Kisdorf, DE;
Martin Bergtholdt, Hamburg, DE;
Lina Arbash Meinel, Homewood, IL (US);
Thomas Buelow, Grosshansdorf, DE;
Rafael Wiemker, Kisdorf, DE;
Martin Bergtholdt, Hamburg, DE;
Lina Arbash Meinel, Homewood, IL (US);
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
When characterizing a tumor or lesion as malignant or benign, a system () receives an image of the lesion volume (), employs a processor () to perform a raw segmentation of the image, the results of which are stored to memory (). Then processor then executes a hole-filling procedure to fill in dark areas in the image of the lesion representing necrotic tissue that absorbed little or no contrast agent, and optionally a leakage removal procedure to remove image voxels associated with non-lesion tissue, e.g., blood vessels, in which the contrast agent was present during imaging, to generate a complete lesion volume. A voxel analyzer () assesses a number of voxels included in the raw segmentation of the lesion image, and the final segmentation (e.g., after filling and optional leakage removal). A segmentation comparator () computes a ratio of dark area voxels related to necrotic tissue detected after the raw segmentation to total voxels detected in the final image segmentation. The ratio is then used to determine a likelihood of malignancy, with a higher ratio indicating a higher likelihood.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile