The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2014
Filed:
Sep. 28, 2010
Takuya Yasuda, Kyoto, JP;
Atsushi Imamura, Kyoto, JP;
Takuya Yasuda, Kyoto, JP;
Atsushi Imamura, Kyoto, JP;
Dainippon Screen Mfg. Co., Ltd., Kyoto, JP;
Abstract
An image inspection apparatus includes a pre-printed element reduction section that reduces influence of a pre-printed element on inspection and generates an inspection object image, and a comparative inspection section that compares the inspection object image with the additionally-recorded data, to inspect a performance level of a result of overprinting. Captured image data of the pre-printed paper image and the overprinted image is given to the pre-printed element reduction section. By using the captured image data of the pre-printed paper image, the pre-printed element reduction section reduces the pre-printed element included in the captured image data of the overprinted image and newly prepares the inspection object image.