The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2014

Filed:

Oct. 29, 2013
Applicant:

Spinella Ip Holdings, Inc., Colts Neck, NJ (US);

Inventors:

William L. Gaddy, Milford, PA (US);

Vidhya Seran, Irving, TX (US);

Assignee:

Spinella IP Holdings, Inc., Colts Neck, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H04N 11/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for occlusion region detection and measurement between a pair of images are disclosed. A processing device receives a first image and a second image. The processing device estimates a field of motion vectors between the first image and the second image. The processing device motion compensates the first image toward the second image to obtain a motion-compensated image. The processing device compares a plurality of pixel values of the motion-compensated image to a plurality of pixels of the first image to estimate an error field. The processing device inputs the error field to a weighted error cost function to obtain an initial occlusion map. The processing device regularizes the initial occlusion map to obtain a regularized occlusion map.


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