The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2014
Filed:
Feb. 18, 2011
John Robert Griesing, Sudbury, MA (US);
Charles R. Wright, Winchester, MA (US);
John Robert Griesing, Sudbury, MA (US);
Charles R. Wright, Winchester, MA (US);
Azimuth Systems, Inc., Acton, MA (US);
Abstract
Improved performance testing of a wireless device is disclosed. The system is particularly suited to testing devices having multiple antennas. The device under test (DUT) is placed in a reverberation chamber with antennas for transmission of a test signal to the DUT. The number of antennas deployed in the reverberation chamber and placement of those antennas is selected such that no line-of-sight transmission component exists from test system antenna to DUT antenna, and the number of antennas deployed in the reverberation chamber is greater than the spatial rank of the signal. The antennas are driven by a programmable channel emulator capable of generating fading, correlation, delay, Doppler and other channel condition phenomena. Furthermore, the antennas are driven individually by a plurality of independent fading processes. The combination of the programmable channel emulator and reverberation chamber creates a multipath environment which simulates signals arriving from different locations, with different delays, as well as the simulation of device motion. The system also includes instruments to produce test signals and to measure the performance of the DUT.