The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2014

Filed:

Oct. 13, 2005
Applicants:

Omer Gila, Cupertino, CA (US);

William David Holland, Mountain View, CA (US);

Eyal Shelef, Tel Aviv, IL;

Shlomo Harush, Nez Ziyonaz, IL;

Inventors:

Omer Gila, Cupertino, CA (US);

William David Holland, Mountain View, CA (US);

Eyal Shelef, Tel Aviv, IL;

Shlomo Harush, Nez Ziyonaz, IL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

Imaging methods, imaging device calibration methods, imaging devices, and hard imaging device sensor assemblies are described. According to one aspect, an imaging method includes forming a hard color image upon media using image data, the hard color image corresponding to the color image, and after the forming, sensing an optical characteristic of the hard color images at a plurality of different spatial locations of individual ones of the hard color images, and providing information regarding the optical characteristic at the different spatial locations of the hard color image after the sensing.


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