The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2014

Filed:

Apr. 23, 2013
Applicants:

Olympus Corporation, Tokyo, JP;

Olympus Medical Systems Corp., Tokyo, JP;

Inventors:

Hideyuki Takaoka, Hachioji, JP;

Kazuhiro Gono, Sagamihara, JP;

Takeshi Suga, Hino, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/00 (2006.01); G01N 21/25 (2006.01); G01N 21/55 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical measurement apparatus includes a connector where a base end portion of a measurement probe introduced into a subject is connected, a light source unit that emits illumination light irradiated from a leading end of the measurement probe, an optical measurement unit that measures reflection light and/or scattering light of the illumination light incident through the measurement probe, a first optical path that transmits the illumination light emitted by the light source unit to the optical measurement unit, a second optical path that transmits, to the measurement probe, the illumination light emitted by the light source unit and transmits, to the optical measurement unit, reflection light and/or scattering light of the illumination light incident through the measurement probe, and an optical path switching unit that switches an optical path for transmitting the illumination light into the first optical path or the second optical path.


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