The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2014
Filed:
Sep. 28, 2012
Inview Technology Corporation, Austin, TX (US);
Richard G. Baraniuk, Houston, TX (US);
Tyler H. Weston, Austin, TX (US);
InView Technology Corporation, Austin, TX (US);
Abstract
A system and method for searching an incident light field for atypical regions (e.g., hot spots or cool spots or spectrally distinctive regions) within the incident light field using a light modulator and a spectral sensing device. Once the atypical regions are identified, the light modulator may be used to mask the incident light field so that the spectral sensing device can make spatially-concentrated measurements of the wavelength spectrum of the atypical regions (or alternatively, the exterior of the atypical regions). Furthermore, in a compressive imaging mode, a sequence of spatial patterns may be supplied to the light modulator, and a corresponding sequence of wavelength spectra may be collected from the spectral sensing device. The wavelength spectra comprise a compressed representation of the incident light field over space and wavelength. The wavelength spectra may be used to reconstruct a multispectral (or hyperspectral) data cube.