The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2014
Filed:
Sep. 11, 2007
Eva Wagner, Bad-Dürkheim, DE;
Thomas Brinz, Bissingen A.D. Teck, DE;
Thomas Geiger, Walddorfhaeslach, DE;
Jane Lewis, Wales, GB;
Markus Tiefenbacher, Fellbach-Schmiden, DE;
Tobias Burk, Tuebingen, DE;
Sebastian Koltzenburg, Dannstadt, DE;
Wolfgang Schrof, Neuleiningen, DE;
Eva Wagner, Bad-Dürkheim, DE;
Thomas Brinz, Bissingen A.D. Teck, DE;
Thomas Geiger, Walddorfhaeslach, DE;
Jane Lewis, Wales, GB;
Markus Tiefenbacher, Fellbach-Schmiden, DE;
Tobias Burk, Tuebingen, DE;
Sebastian Koltzenburg, Dannstadt, DE;
Wolfgang Schrof, Neuleiningen, DE;
Robert Bosch GmbH, Stuttgart, DE;
BASF AG, Ludwigshafen, DE;
Abstract
In a method for evaluating mechanical tests of a coating on a substrate, in a first step a mechanical stress is applied onto the coating, in a second step the substrate having the coating is isothermally clamped, in a third step an infrared photograph is generated of the region in which the mechanical stress is applied onto the coating in the first step, and in a fourth step the infrared photograph is evaluated. A device is arranged for carrying out the method.