The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2014

Filed:

Jan. 21, 2009
Applicants:

Tadashi Sasakawa, Tokyo, JP;

Kikuo Tachibana, Tokyo, JP;

Inventors:

Tadashi Sasakawa, Tokyo, JP;

Kikuo Tachibana, Tokyo, JP;

Assignee:

Pasco Corporation, Tokyo, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 15/10 (2011.01); G06T 15/20 (2011.01);
U.S. Cl.
CPC ...
Abstract

The method includes divisionally-capturing a target region from a platform such as an airplane () by rendering viewing angles as being different from each other as well as rendering a focal length (f, f') as being different with reference to a predetermined ground resolution, thereafter generating an elevation model () of the entire target region () in accordance with matching of elevation models () generated based on respective divisionally-captured images () between image capturing overlap regions (), and generating an orthophoto image of the entire target region by applying an orthogonal projection transformation processing to the respective divisionally-captured images () by use of altitude information of the elevation model ().


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