The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2014
Filed:
Apr. 08, 2011
Masayuki Maruyama, Chiyoda-ku, JP;
Hiroyuki Kozuki, Chiyoda-ku, JP;
Katsuya Ikemoto, Chiyoda-ku, JP;
Masayuki Maruyama, Chiyoda-ku, JP;
Hiroyuki Kozuki, Chiyoda-ku, JP;
Katsuya Ikemoto, Chiyoda-ku, JP;
Mitsubishi Electric Corporation, Tokyo, JP;
Abstract
A main microcomputer abnormality determination section checks whether or not a voltage value of Vcc based on digital data output from a main microcomputer analog-to-digital converter is equal to or higher than a threshold value to thereby perform abnormality determination for the main microcomputer analog-to-digital converter and Vref. A sub microcomputer abnormality determination section checks whether or not the voltage value of Vcc is equal to or higher than a threshold value based on digital data output from a sub microcomputer analog-to-digital converter to thereby perform abnormality determination for the sub microcomputer analog-to-digital converter and Vref. An abnormality identifying section identifies an abnormality occurring site by using both results of the abnormality determination performed by the main microcomputer abnormality determination section and the sub microcomputer abnormality determination section.