The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2014

Filed:

Oct. 20, 2010
Applicant:

DE He Weng, Shenzhen, CN;

Inventor:

De He Weng, Shenzhen, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/561 (2006.01); G01R 33/565 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5616 (2013.01); G01R 33/56554 (2013.01); G01R 33/56563 (2013.01); G01R 33/56536 (2013.01);
Abstract

In a method and system for echo planar imaging, after having applied a radiofrequency pulse and a slice selection gradient, continuous readout gradients alternating between positive and negative are applied and a phase encoding gradient is applied before starting each readout gradient. A slice selection gradient is applied at the same time as applying the phase encoding gradient. Scanning signals are collected during the duration of the readout gradients. Image reconstruction is implemented based on the scanning signals to obtain a scanned image.


Find Patent Forward Citations

Weng, De. (2014). Method and system for echo planar imaging with slice selection also occurring concurrently with phase encoding, during readout (U.S. Patent No. 8717025). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8717025

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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