The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2014
Filed:
Jul. 08, 2009
Hui Han, Fredericton, CA;
Bruce Balcom, Fredericton, CA;
Hui Han, Fredericton, CA;
Bruce Balcom, Fredericton, CA;
University of New Brunswick, Fredericton, New Brunswick, CA;
Abstract
A method based on pure phase encode FIDs that permits high strength gradient measurement is disclosed. A small doped water phantom (1˜3 mm droplet, T, T, T*<100 μs) within a microprobe is excited by a series of closely spaced broadband RF pulses each followed by single FID point acquisition. Two trial gradient waveforms illustrate the technique, neither of which could be measured by the conventional microprobe measurement. The first is an extended duration gradient waveform while the other illustrates this method's ability to measure gradient waveforms with large net area and/or high amplitude. This method is a point monitor with simple implementation and low cost hardware requirements.