The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2014

Filed:

Feb. 12, 2010
Applicants:

Chinwuba Ezekwe, Albany, CA (US);

Thomas Rocznik, Arnstadt, DE;

Christoph Lang, Cupertino, CA (US);

Sam Kavusi, Menlo Park, CA (US);

Martin Kramer, Grunstadt, DE;

Inventors:

Chinwuba Ezekwe, Albany, CA (US);

Thomas Rocznik, Arnstadt, DE;

Christoph Lang, Cupertino, CA (US);

Sam Kavusi, Menlo Park, CA (US);

Martin Kramer, Grunstadt, DE;

Assignee:

Robert Bosch GmbH, Stuttgart, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A magnetic field measuring system is disclosed. The magnetic field measuring system includes a substrate, a conductive well formed in the substrate, the well having a first side with a first length, a first contact electrically coupled to the conductive well at a first location of the first side, a second contact electrically coupled to the conductive well at a second location of the first side, wherein the distance between the first location and the second location is less than the first length, a stimulus circuit coupled to the first contact and the second contact, and a sensor for identifying a property indicative of the length of a current path from the first location to the second location through the conductive well.


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