The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2014

Filed:

Jan. 18, 2012
Applicant:

Meng Cui, Ashburn, VA (US);

Inventor:

Meng Cui, Ashburn, VA (US);

Assignee:

Howard Hughes Medical Institute, Chevy Chase, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/58 (2006.01); G01B 9/02 (2006.01); G02B 27/00 (2006.01); A61B 5/00 (2006.01); G01J 3/45 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02091 (2013.01); G02B 27/0031 (2013.01); A61B 5/0062 (2013.01); G01J 3/45 (2013.01);
Abstract

An apparatus includes a transverse scanning optical system in the path of a first light beam traveling along a first optic axis; a wavefront correction system in the path of a second light beam traveling along a second optic axis, the wavefront correction system including a wavefront correction device having a spatial phase profile on its surface; a beam combiner that receives the first light beam and the second light beam and outputs an interference beam having a beat frequency equal to a difference frequency between the first light beam and second light beam; and a detection system placed relative to a random scattering medium, which is in the path of the interference beam. The detection system detects measurement light produced by the random scattering medium while the interference beam strikes the random scattering medium.


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