The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2014
Filed:
Oct. 22, 2009
Robert S. Miyaoka, Shoreline, WA (US);
Kyle Champley, Ballston Spa, NY (US);
Lawrence Macdonald, Seattle, WA (US);
Thomas K. Lewellen, Port Ludlow, WA (US);
Robert S. Miyaoka, Shoreline, WA (US);
Kyle Champley, Ballston Spa, NY (US);
Lawrence MacDonald, Seattle, WA (US);
Thomas K. Lewellen, Port Ludlow, WA (US);
University of Washington, Seattle, WA (US);
Abstract
A method for estimating a line or response in a positron emission tomography scanner having depth of interaction estimation capability. The method utilizes information from both detector modules detecting a coincident event. A joint probability density function combining factors accounting for intermediate Compton scattering interactions and/or a final interaction that may be either a Compton scattering interaction or photoelectric absorption is calculated. In a preferred embodiment, a Bayesian estimation scheme is used to integrate the PDF for all permutations of the measured signal pairs, and the permutation with the largest joint probability is selected to construct the estimated line of response.