The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2014

Filed:

May. 29, 2012
Applicants:

Samuel Chen, Penfield, NY (US);

Mark C. Rzadca, Fairport, NY (US);

Inventors:

Samuel Chen, Penfield, NY (US);

Mark C. Rzadca, Fairport, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B41J 29/393 (2006.01); B41J 2/21 (2006.01); B41J 11/00 (2006.01);
U.S. Cl.
CPC ...
B41J 29/393 (2013.01); B41J 2/2135 (2013.01); B41J 11/009 (2013.01);
Abstract

A printing system includes a print media and one or more non-objectionable test patterns formed or printed on the print media. An integrated imaging system captures images of the one or more non-objectionable test patterns. The integrated imaging system includes a housing, an opening in the housing for receiving light reflected from a moving print media, a folded optical assembly in the housing that receives the reflected light and transmits the light a predetermined distance, and an image sensor within the housing that receives the light and captures one or more images of the one or more non-objectionable test patterns. A processing device can process the one or more images to determine if one or more size variations have occurred in the print media.


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