The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2014

Filed:

Mar. 28, 2012
Applicants:

Xiangping Chen, Shrewsbury, MA (US);

Richard P. Ruef, Santa Cruz, CA (US);

Philippe Armangau, Acton, MA (US);

Karl M. Owen, Chapel Hill, NC (US);

Mark K. Ku, Wollaston, MA (US);

Inventors:

Xiangping Chen, Shrewsbury, MA (US);

Richard P. Ruef, Santa Cruz, CA (US);

Philippe Armangau, Acton, MA (US);

Karl M. Owen, Chapel Hill, NC (US);

Mark K. Ku, Wollaston, MA (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method is used in managing deduplication density. A deduplication density of a data object is determined. The deduplication density is indicated by a number of deduplicated data objects represented by the data object. Based on the deduplication density of the data object, the data object is skipped for applying a deduplicating technique to the data object. An association is created between the data object and another data object. The other data object is used for applying the deduplicating technique where contents of the other data object are identical to contents of the data object.


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