The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2014

Filed:

Mar. 29, 2010
Applicants:

Randall L. Bickford, Orangevale, CA (US);

Rahul M. Palnitkar, Lincoln, CA (US);

Inventors:

Randall L. Bickford, Orangevale, CA (US);

Rahul M. Palnitkar, Lincoln, CA (US);

Assignee:

Intellectual Assets LLC, Lake Tahoe, NV (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01); G06N 99/00 (2010.01); G01D 3/02 (2006.01); G06Q 50/06 (2012.01);
U.S. Cl.
CPC ...
G06N 99/005 (2013.01); G01D 3/022 (2013.01); G06Q 50/06 (2013.01);
Abstract

A computer-implemented dynamic data filtering system and method for selectively choosing operating data of a monitored asset that modifies or expands a learned scope of an empirical model of normal operation of the monitored asset while simultaneously rejecting operating data of the monitored asset that is indicative of excessive degradation or impending failure of the monitored asset, and utilizing the selectively chosen data for adaptively recalibrating the empirical model to more accurately monitor asset aging changes or operating condition changes of the monitored asset.


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