The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2014

Filed:

Jul. 05, 2011
Applicants:

Deogratius Musiige, Albertslund, DK;

Vincent Laulagnet, Frederiskberg, DK;

Inventors:

Deogratius Musiige, Albertslund, DK;

Vincent Laulagnet, Frederiskberg, DK;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/60 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention proposes methods, devices and computer program products. To this extent, there is defined a set X including N distinct parameter values x_i for at least one input parameter x, N being an integer greater than or equal to 1, first measured the physical quantity Pmfor each of the N distinct parameter values x_i of the at least one input parameter x, while keeping all other input parameters fixed, constructed a Vandermonde matrix VM using the set of N parameter values x_i of the at least one input parameter x, and computed the model W for emulating the physical quantity P based on the Vandermonde matrix and the first measured physical quantity according to the equation W=(VM*VM)*VM*Pm. The model is iteratively refined so as to obtained a desired emulation precision. The model can later be used to emulate the physical quantity based on input parameters or logs taken from the field and thereby support device design optimization.


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