The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2014
Filed:
Dec. 01, 2010
Zhiguo LI, Webster, NY (US);
Gregory Kott, Fairport, NY (US);
Zhiguo Li, Webster, NY (US);
Gregory Kott, Fairport, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
A method and system for accurately predicting the remaining useful life of devices and components based on rigorous statistical analysis data to reduce service costs by implementing condition-based maintenance. One rigorous statistical model is the general degradation path model, which can be used to generate simulated data that shares similar data characteristics of historical field failure data. This generated data can be used in a reliability study based on, for example, Monte Carlo techniques for RUL prediction. The study can be used to investigate the effects of influential factors such as suspension percentage and heavy-tailed behavior. The remaining useful life prediction is based on both the fixed-time predictors and time-dependent covariates.