The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2014
Filed:
Sep. 10, 2010
Jui-yiao Su, Hsinchu, TW;
Yu-liang Chung, Hsinchu, TW;
Chun-chieh Wang, Hsinchu, TW;
Chien-feng Wu, Hsinchu, TW;
Yan-chen Liu, Hsinchu, TW;
Jui-Yiao Su, Hsinchu, TW;
Yu-Liang Chung, Hsinchu, TW;
Chun-Chieh Wang, Hsinchu, TW;
Chien-Feng Wu, Hsinchu, TW;
Yan-Chen Liu, Hsinchu, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
A defect detection system and method enable a fastened crystalline silicon product to generate micro-vibration by a micro-vibration excitation device, so as to enable the crystalline silicon product to generate an excitation signal, then to acquire the excitation signal by a acquisition device, so as to analyze the excitation signal acquired by the acquisition device in the time and frequency domain by an analysis detection device with a specific analysis, and to obtain an analysis result, at last, determine a defect state of the crystalline silicon product according to the analysis result.