The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2014
Filed:
Mar. 23, 2009
Mitsugu Takahashi, Tochigi, JP;
Takafumi Murakoshi, Tochigi, JP;
Masaru Maruo, Tochigi, JP;
Atsushi Osada, Tochigi, JP;
Hidetoshi Takahashi, Tochigi, JP;
Takao Shibayama, Tochigi, JP;
Mitsugu Takahashi, Tochigi, JP;
Takafumi Murakoshi, Tochigi, JP;
Masaru Maruo, Tochigi, JP;
Atsushi Osada, Tochigi, JP;
Hidetoshi Takahashi, Tochigi, JP;
Takao Shibayama, Tochigi, JP;
Honda Motor Co., Ltd., Tokyo, JP;
Abstract
Provided is a work measuring method by which a deviation quantity of a work measuring point from a reference position can be measured in a short time. A work surface is set as a reference point when the measuring point is positioned at the reference position, and a distance from a photographing device to a reference surface is set as a reference distance. A deviation quantity of the measurement point in a direction intersecting a photographing direction on the reference surface is measured by the photographing device, and a deviation quantity of the measuring point in the photographing direction is measured by a laser distance sensor. Then, based on the deviation quantity measured by the photographing device, the deviation quantity measured by the laser distance sensor, and the reference distance, a deviation quantity of the measuring point in a direction intersecting the photographing direction is calculated.