The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2014
Filed:
Mar. 09, 2011
Oscar Chi Lim AU, Hong Kong, CN;
LU Fang, Hong Kong, CN;
Oscar Chi Lim Au, Hong Kong, CN;
Lu Fang, Hong Kong, CN;
Dynamic Invention LLC, Mahe, SC;
Abstract
Systems, methods, and apparatus for sampling images using minimum mean square error subpixel-based down-sampling (MMSE-SD) are presented herein. A partition component can receive a first array of pixels, and divide the first array of pixels into two-dimensional (2-D) blocks of pixels. Further, a sampling component can diagonally down-sample subpixels of a block of the 2-D blocks, and generate a second array of pixels based on the down-sampled subpixels. The sampling component can alternately sample subpixels of adjacent pixels of the block in a diagonal direction, and generate the second array of pixels based on the subpixels. A reconstruction component can create a virtual image based on, at least in part, the second array of pixels. A MMSE-SD component can determine an optimal low resolution image based on, at least in part, respective color components of the virtual image and a high resolution image associated with the first array of pixels.