The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2014

Filed:

Feb. 03, 2012
Applicants:

Mark Rahmes, Melbourne, FL (US);

J. Hartan Yates, Melbourne, FL (US);

Morteza Akbari, Rockledge, FL (US);

Gnana Bhaskar Tenali, Melbourne, FL (US);

Inventors:

Mark Rahmes, Melbourne, FL (US);

J. Hartan Yates, Melbourne, FL (US);

Morteza Akbari, Rockledge, FL (US);

Gnana Bhaskar Tenali, Melbourne, FL (US);

Assignee:

Harris Corporation, Melbourne, FL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method for improving the quality of a set of a three dimensional (3D) point cloud data representing a physical surface by detecting and filling null spaces (). The method includes analyzing () the data to identify the presence of a plurality of level 1 fractals (), each defined by a plurality of voxels () containing data points arranged in one of a plurality of three-dimensional patterns. The method also includes selectively filling () voxels in the 3D point cloud data with a first predetermined limited number of data points to increase a number of instances where level 2 fractals () can be used for representing the 3D point cloud data. Each level 2 fractal is defined as a common plurality of the level 1 fractals having a common three-dimensional pattern, where the common plurality of level 1 fractals are also arranged in accordance with the common three dimensional pattern.


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