The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2014
Filed:
Jan. 25, 2013
Applicant:
Nokia Corporation, Espoo, FI;
Inventors:
Xiang Guang Che, Beijing, CN;
Kari Pekka Pajukoski, Oulu, FI;
Peter Skov, Beijing, CN;
Esa Tapani Tiirola, Kempele, FI;
Assignee:
Nokia Corporation, Espoo, FI;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 1/16 (2006.01); H04W 52/04 (2009.01);
U.S. Cl.
CPC ...
H04W 52/04 (2013.01);
Abstract
Embodiments of the present invention provide methods, systems and apparatuses for optimizing downlink path loss (PL) measurements in time division duplex (TDD) systems enabling fast power control targeting to decrease fading margin. In one embodiment, a method of power control in a long term evolution time division duplex (TDD) system is provided. The method includes controlling a length of a path loss measurement filter based on an allocation type. A width and frequency position of the path loss measurement filter is made dependent on the allocation type.