The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2014

Filed:

Sep. 21, 2011
Applicants:

Soung Hoon Sim, Yongin-si, KR;

Jong Hoon Jung, Hwaseong-si, KR;

Inventors:

Soung Hoon Sim, Yongin-si, KR;

Jong Hoon Jung, Hwaseong-si, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 7/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test operation method of a memory device includes a reference current generator generating a reference current and providing a reference voltage generated based on the reference current to one of input terminals of a sense amplifier; providing a read voltage generated based on a read current of a memory cell to another one of the input terminals of the sense amplifier; and the sense amplifier comparing the reference voltage with the read voltage.


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Sim, Soung. (2014). Memory device, test operation method thereof, and system including the same (U.S. Patent No. 8711641). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8711641

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