The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2014
Filed:
Jun. 24, 2011
Theen-leong Fong, Puchong, MY;
William Chong, Shah Alam, MY;
Hasni Zaidy Abdul Hamid, Kuala Lumpur, MY;
Muhammad Nur Syukri Bin Ahmad Shukor, Karak, MY;
Syaiful Hazli Hamdan, Subang Jaya, MY;
Petrus HU, Petaling Jaya, MY;
Philip Bernard Saram, Kuala Lumpur, MY;
Theen-Leong Fong, Puchong, MY;
William Chong, Shah Alam, MY;
Hasni Zaidy Abdul Hamid, Kuala Lumpur, MY;
Muhammad Nur Syukri Bin Ahmad Shukor, Karak, MY;
Syaiful Hazli Hamdan, Subang Jaya, MY;
Petrus Hu, Petaling Jaya, MY;
Philip Bernard Saram, Kuala Lumpur, MY;
Western Digital Technologies, Inc., Irvine, CA (US);
Abstract
A disk drive is disclosed that enables defect margining during disk drive burn-in testing. The disk drive comprises: a disk comprising a plurality of tracks; a head actuated over the disk; and a processor. The processor is configured to: perform disk drive burn-in testing to detect media defects; generate an initial defect list based upon detected media defects for sectors; generate an extended defect list that includes detected media defects and extended defect margins from the detected media defects; and utilize the extended defect list for burn-in, wherein a spare area of the disk allows for the detected media defects and the extended defect margins.