The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2014
Filed:
Nov. 09, 2011
Lee E. Estes, Mattapoisett, MA (US);
Peter J. Hendricks, Portsmouth, RI (US);
Adam Jilling, Portsmouth, RI (US);
Lee E. Estes, Mattapoisett, MA (US);
Peter J. Hendricks, Portsmouth, RI (US);
Adam Jilling, Portsmouth, RI (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
A method is provided for remotely measuring index of refraction fluctuations. From a first location, an optical beam is focused at a focal plane located at a second location in a medium of interest. As a result, a beam of energy is backscattered towards the first location. At the first location, a size of the backscattered beam is determined where the size is indicative of strength of fluctuations in the medium's index of refraction.