The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2014

Filed:

Jul. 30, 2007
Applicants:

Jeffrey P. Johnson, Lawrenceville, NJ (US);

John Patrick Collins, Cleveland Heights, OH (US);

Mariappan S. Nadar, Plainsboro, NJ (US);

John S. Nafziger, Morrisville, PA (US);

Thomas Stingl, Erlangen, DE;

Daphne Yu, Yardley, PA (US);

Inventors:

Jeffrey P. Johnson, Lawrenceville, NJ (US);

John Patrick Collins, Cleveland Heights, OH (US);

Mariappan S. Nadar, Plainsboro, NJ (US);

John S. Nafziger, Morrisville, PA (US);

Thomas Stingl, Erlangen, DE;

Daphne Yu, Yardley, PA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Artifact quantification is provided in volume rendering. Since the visual conspicuity of rendering artifacts strongly influences subjective assessments of image quality, quantitative metrics that accurately correlate with human visual perception may provide consistent values over a range of imaging conditions.


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