The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2014
Filed:
Nov. 29, 2010
Xiuling Zhu, Tuen Mun, HK;
Chenjung Tsai, Shatin, HK;
Xiuling Zhu, Tuen Mun, HK;
Chenjung Tsai, Shatin, HK;
Hong Kong Applied Science and Technology Research Institute Co. Ltd., Shatin, New Territories, HK;
Abstract
A coordinate locating apparatus for locating at least one touch point on a plane and the method thereof are provided. The coordinate locating apparatus comprises: a first detecting unit, comprising a first light emitting element and a first light receiving element, arranged at a first location of the plane; a second detecting unit, comprising a second light emitting element and a second light receiving element, arranged at a second location of the plane; a first optical element arranged along an edge of the plane for reflecting and retro-reflecting light from the first and the second light emitting elements; and a second and third optical elements arranged along two edges of the plane for performing at least one of reflecting and retro-reflecting light from the first and the second light emitting elements or light reflected from the first optical element, both of the two edges being adjacent to the edge along which the first optical element is arranged, wherein the at least one touch point is located on the basis of the detected intensities of light received by the first and the second light receiving elements, and the detected intensities of light are compared with a first threshold and a second threshold.