The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2014
Filed:
Feb. 07, 2011
Toshihiko Kiwa, Okayama, JP;
Keiji Tsukada, Okayama, JP;
Toshihiko Kiwa, Okayama, JP;
Keiji Tsukada, Okayama, JP;
National University Corporation Okayama University, Okayama-shi, Okayama, JP;
Abstract
Provided are a measuring device and a measuring method that use terahertz light, by which a substance to be detected can be detected with high sensitivity and high accuracy. A measuring device using a pulsed electromagnetic wave is provided with a substance detection plate, a means for generating the pulsed electromagnetic wave having amplitude intensity dependent on the amount of a substance to be detected at an irradiation position by irradiating the substance detection plate with a pulsed laser beam, and a detection means for detecting the amplitude intensity of the pulsed electromagnetic wave, and measures the change of the state of a solution containing the substance to be detected on the basis of the amplitude intensity.