The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2014
Filed:
Jun. 01, 2012
Margret Elaine Leventhal, Berkeley, CA (US);
Heather Ann Koshinsky, El Cerrito, CA (US);
Michael Steven Zwick, Vacaville, CA (US);
Charles Robert Bupp, Ii, Lafayette, CA (US);
Margret Elaine Leventhal, Berkeley, CA (US);
Heather Ann Koshinsky, El Cerrito, CA (US);
Michael Steven Zwick, Vacaville, CA (US);
Charles Robert Bupp, II, Lafayette, CA (US);
Investigen, Inc., Hercules, CA (US);
Abstract
Laboratory spatula having stalk regions with a hollow first end and a hollow second end and at manipulating regions may be used for collecting, transporting or storing a material. A manipulating region may be configured as a shovel region, a scoop region, a whisk region, a punch region, a sieve region, a loop region, a cutting edge, a spreading region, a grinding region, a hook region, a scraper region, a tweezer region, a grasper region, or a pick region. The spatula may be lightweight and disposable, and may be any appropriate size including micro size, a regular size, or a macro size. The spatula may also have an anti-stick surface. The spatula may be calibrated, and may include calibration marks or additional features.