The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2014
Filed:
Apr. 19, 2011
Yuji Unagami, Osaka, JP;
Yuichi Futa, Osaka, JP;
Natsume Matsuzaki, Osaka, JP;
Hiroki Shizuya, Sendai, JP;
Masao Sakai, Sendai, JP;
Shuji Isobe, Sendai, JP;
Eisuke Koizumi, Sendai, JP;
Shingo Hasegawa, Sendai, JP;
Yuji Unagami, Osaka, JP;
Yuichi Futa, Osaka, JP;
Natsume Matsuzaki, Osaka, JP;
Hiroki Shizuya, Sendai, JP;
Masao Sakai, Sendai, JP;
Shuji Isobe, Sendai, JP;
Eisuke Koizumi, Sendai, JP;
Shingo Hasegawa, Sendai, JP;
Panasonic Corporation, Osaka, JP;
Abstract
An information security apparatus includes a plurality of monitoring modules that monitor for tampering. A management apparatus includes a reception unit that receives a plurality of monitoring results each generated by a source monitoring module monitoring a target monitoring module; a detection unit that detects an abnormality by referring to fewer than all of the received monitoring results; and an identification unit that identifies, when an abnormality is detected, a monitoring module that has been tampered with from among (i) a monitoring module that generates a monitoring result related to the abnormality, and (ii) one or more monitoring modules identified by tracing back through a chain of monitoring modules consecutively from the target of monitoring to the source of monitoring, starting from the monitoring module that generates the monitoring result related to the abnormality.