The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2014
Filed:
Nov. 09, 2012
Lsi Corporation, Milpitas, CA (US);
LSI Corporation, San Jose, CA (US);
Abstract
Techniques for use in integrated circuit design systems for extracting noise threshold data for selected cells. For example, a method comprises the following steps. A cell is selected from one or more cells in a given collection of standardized cells. Each of the one or more cells represents one or more functional circuit design blocks that are usable as part of a design of an integrated circuit. A noise signal is generated or selected. The noise signal is applied to an input node of the selected cell. Noise threshold data is identified using a noise analysis module, for a given set of process, voltage and temperature variations, for an output node of the selected cell based on the noise signal applied to the input node of the selected cell. The noise threshold data is stored with the selected cell as part of the given collection of standardized cells such that the noise threshold data is subsequently usable during a post layout noise analysis operation of an integrated circuit design that includes the selected cell.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile