The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2014
Filed:
Aug. 31, 2010
Thomas W. Chang, Sunnyvale, CA (US);
Adil Syed, Santa Clara, CA (US);
David A. Donovan, Oakland, CA (US);
Thomas W. Chang, Sunnyvale, CA (US);
Adil Syed, Santa Clara, CA (US);
David A. Donovan, Oakland, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
A method for testing wireless devices under test (DUTs) in a wireless test station is provided. Each test station may include a test unit, a test chamber with an antenna, and a radio-frequency (RF) cable that connects the test unit to the test chamber. Reference DUTs may be used to calibrate each test station to compute a corrected linear equation based on a nominal path loss value. Over-the-air (OTA) path loss of each test station may not be directly measured. Once calibrated, the test chambers may be used during product testing to test factory DUTs to determine whether a particular factory DUT satisfies pass/fail criteria. During product testing, measured output power levels may be compared with expected output power levels computed using the corrected linear equation. The amount of error between the measured and expected output power levels will determine whether a production DUT satisfies the pass/fail criteria.