The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2014

Filed:

Jan. 03, 2013
Applicants:

Simon Barker, Sudbury, MA (US);

Adam Wagman, Wilmington, MA (US);

Aaron Wallack, Natick, MA (US);

David J Michael, Wayland, MA (US);

Inventors:

Simon Barker, Sudbury, MA (US);

Adam Wagman, Wilmington, MA (US);

Aaron Wallack, Natick, MA (US);

David J Michael, Wayland, MA (US);

Assignee:

Cognex Corporation, Natick, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6256 (2013.01);
Abstract

A method for training a pattern recognition algorithm including the steps of identifying the known location of the pattern that includes repeating elements within a fine resolution image, using the fine resolution image to train a model associated with the fine image, using the model to examine the fine image resolution image to generate a score space, examining the score space to identify a repeating pattern frequency, using a coarse image that is coarser than the finest image resolution image to train a model associated with the coarse image, using the model associated with the coarse image to examine the coarse image thereby generating a location error, comparing the location error to the repeating pattern frequency and determining if the coarse image resolution is suitable for locating the pattern within a fraction of one pitch of the repeating elements.


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