The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2014
Filed:
Nov. 18, 2011
Qiang Zhang, Tempe, AZ (US);
Xinyu Xu, Camas, WA (US);
Chang Yuan, Camas, WA (US);
Hae-jong Seo, Vancouver, WA (US);
Petrus J. L. Van Beek, Camas, WA (US);
Qiang Zhang, Tempe, AZ (US);
Xinyu Xu, Camas, WA (US);
Chang Yuan, Camas, WA (US);
Hae-Jong Seo, Vancouver, WA (US);
Petrus J. L. Van Beek, Camas, WA (US);
Sharp Laboratories of America, Inc., Camas, WA (US);
Abstract
An electronic device configured for defect detection is described. The electronic device includes a processor and instructions stored in memory that is in electronic communication with the processor. The electronic device performs background suppression on the image data based on a transform of the image data to obtain a score map. The electronic device also applies thresholding to the score map to generate a detection mask. The thresholding comprises bi-thresholding. The electronic device additionally detects any defects based on the detection mask. The electronic device further indicates any defects.