The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2014
Filed:
Apr. 15, 2011
Lei Zhu, Atlanta, GA (US);
Tianye Niu, Atlanta, GA (US);
Lei Zhu, Atlanta, GA (US);
Tianye Niu, Atlanta, GA (US);
Georgia Tech Research Corporation, Atlanta, GA (US);
Abstract
Described herein are improved methods for correcting cone beam computed tomography signals to reduce scatter contamination contained therein. Generally, the improved methods involve generating a plurality of two-dimensional projection images of a subject from a three-dimensional multi-detector computed tomography image of the subject. This is followed by subtracting the plurality of two-dimensional projection images from a plurality of two-dimensional cone beam projection images of the subject to produce a plurality of two-dimensional estimated error projections that comprise an estimated error in the plurality of two-dimensional cone beam projection images. The plurality of two-dimensional estimated error projection images are subtracted from the plurality of two-dimensional cone beam projection images to generate a plurality of two-dimensional corrected cone beam projection images. A three-dimensional corrected cone beam computed tomography image of the subject is then constructed from the plurality of two-dimensional corrected cone beam projection images.