The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2014

Filed:

Jun. 02, 2011
Applicants:

Ziv Harish, Tenafly, NJ (US);

Isaac Rubinstein, Haworth, NJ (US);

Ehud Arbit, Englewood, NJ (US);

Russ Weinzimmer, Milford, NH (US);

Inventors:

Ziv Harish, Tenafly, NJ (US);

Isaac Rubinstein, Haworth, NJ (US);

Ehud Arbit, Englewood, NJ (US);

Russ Weinzimmer, Milford, NH (US);

Assignee:

Newel Dexter LLC, Tenafly, NH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A breast examination system is disclosed that facilitates normalized quantitative comparison of results from multiple examinations performed under differing conditions, such as different viewing angles. The proposed system can operate on a camera-equipped smart-phone, a camera-equipped desk-top computer, or on a dedicated device to perform a guided breast cancer examination, and then store results of the examination in a normalized format that allows effective quantitative comparison to historic results, thereby detecting changes and trends. The results can be stored on the local device, or on a web-based server, providing various data comparison, data management, and data interpretation services in a secure and controlled manner.


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