The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2014
Filed:
Sep. 02, 2009
Lifeng Yu, Rochester, MN (US);
Cynthia H. Mccollough, Byron, MN (US);
Lifeng Yu, Rochester, MN (US);
Cynthia H. McCollough, Byron, MN (US);
MAYO Foundation for Medical Education and Research, Rochester, MN (US);
Abstract
A system and method for the accurate quantitative evaluation of dual-energy computed tomography (CT) projection data that is acquired in a dual-source helical scan includes employing a dual-source z-axis helical interpolation method. The method includes transforming the two helical projection data sets, where corresponding projections of high- and low-energy data sets are shifted with respect to one another by 90 degrees or another angle, into corresponding non-helical projection data sets. A dual-source helical interpolation algorithm allows for projection space dual-energy processing by realigning the high- and low-energy datasets based on the z-axis interpolation. This algorithm may be implemented using a variety of interpolation schemes and can be extended from single slice to multi-slice data acquisitions. Subsequent to the registration of the non-helical projection data sets, projection space processing allows for accurate material quantification and virtual monochromatic images in which beam hardening artifacts have been substantially suppressed.