The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2014

Filed:

Dec. 21, 2011
Applicants:

Woo Han Yun, Daejeon, KR;

DO Hyung Kim, Daejeon, KR;

Jae Yeon Lee, Daejeon, KR;

Kyu Dae Ban, Gyeongsangbuk-do, KR;

Dae Ha Lee, Daejeon, KR;

Mun Sung Han, Daejeon, KR;

Ho Sub Yoon, Daejeon, KR;

Su Young Chi, Daejeon, KR;

Yun Koo Chung, Daejeon, KR;

Joo Chan Sohn, Daejeon, KR;

Hye Jin Kim, Daejeon, KR;

Young Woo Yoon, Daejeon, KR;

Jae Hong Kim, Daejeon, KR;

Jae IL Cho, Daejeon, KR;

Inventors:

Woo Han Yun, Daejeon, KR;

Do Hyung Kim, Daejeon, KR;

Jae Yeon Lee, Daejeon, KR;

Kyu Dae Ban, Gyeongsangbuk-do, KR;

Dae Ha Lee, Daejeon, KR;

Mun Sung Han, Daejeon, KR;

Ho Sub Yoon, Daejeon, KR;

Su Young Chi, Daejeon, KR;

Yun Koo Chung, Daejeon, KR;

Joo Chan Sohn, Daejeon, KR;

Hye Jin Kim, Daejeon, KR;

Young Woo Yoon, Daejeon, KR;

Jae Hong Kim, Daejeon, KR;

Jae Il Cho, Daejeon, KR;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a method of detecting an upper body. The method includes detecting an omega candidate area including a shape formed of a face and a shoulder line of a human from a target image, cutting the target image into the upper body candidate area including the omega candidate area, detecting a human face from the upper body candidate area, and judging whether the upper body of the human is included in the target image according to the result of detecting the human face.


Find Patent Forward Citations

Loading…