The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2014

Filed:

Nov. 23, 2009
Applicants:

Victor Grubsky, Chatsworth, CA (US);

Tomasz Jannson, Torrance, CA (US);

Edward Matthew Patton, Torrance, CA (US);

Volodymyr Romanoov, Torrance, CA (US);

Gennady Medvedkin, Torrance, CA (US);

Paul Shnitser, Irvine, CA (US);

Keith Shoemaker, Harbor City, CA (US);

Inventors:

Victor Grubsky, Chatsworth, CA (US);

Tomasz Jannson, Torrance, CA (US);

Edward Matthew Patton, Torrance, CA (US);

Volodymyr Romanoov, Torrance, CA (US);

Gennady Medvedkin, Torrance, CA (US);

Paul Shnitser, Irvine, CA (US);

Keith Shoemaker, Harbor City, CA (US);

Assignee:

Physical Optics Corporation, Torrance, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides systems and methods for x-ray imaging. In some embodiments, an aperture, or a plurality thereof, are configured to have image transfer functions lacking a zero within a usable spatial frequency range. In further embodiments, the image transfer function is determined according to the shape of the aperture and the usable spatial frequency range is determined according to a usable signal to noise ratio.


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