The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2014

Filed:

Mar. 22, 2011
Applicants:

Swaroop Venkatesh, Dublin, CA (US);

Sergey Timofeev, Santa Clara, CA (US);

Sudhir Srinivasa, Sunnyvale, CA (US);

Atul Salhotra, Santa Clara, CA (US);

Rohit U. Nabar, Santa Clara, CA (US);

Inventors:

Swaroop Venkatesh, Dublin, CA (US);

Sergey Timofeev, Santa Clara, CA (US);

Sudhir Srinivasa, Sunnyvale, CA (US);

Atul Salhotra, Santa Clara, CA (US);

Rohit U. Nabar, Santa Clara, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 7/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a method for detecting a synchronization field in an orthogonal frequency division multiplexing (OFDM) signal, a plurality of discrete Fourier transform (DFT) values corresponding to the OFDM signal are generated. A plurality of magnitude or power values corresponding to the plurality of DFT values is determined. It is determined whether the plurality of magnitude or power values corresponds to a pattern of magnitude or power values. An indication that the synchronization field is detected in the OFDM signal is generated based on whether it is determined that the plurality of magnitude or power values correspond to the pattern of magnitude or power values.


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