The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2014

Filed:

Dec. 06, 2011
Applicants:

Koichi Maruyama, Tokyo, JP;

Yoshiyuki Tashiro, Tokyo, JP;

Daisuke Koreeda, Saitama-ken, JP;

Inventors:

Koichi Maruyama, Tokyo, JP;

Yoshiyuki Tashiro, Tokyo, JP;

Daisuke Koreeda, Saitama-ken, JP;

Assignee:

Hoya Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 7/135 (2012.01);
U.S. Cl.
CPC ...
Abstract

A method of designing an optical element to be used for an optical system in which each of a plurality of light beams having different design wavelengths passes through the optical element is provided. The method includes determining at least two types of optical path difference functions including first and second optical path difference functions in such a manner that proportion, brought by the first optical path difference function, between diffraction orders at which diffraction efficiencies of the plurality of light beams are maximized is different from proportion, brought by the second optical path difference function, between diffraction orders at which diffraction efficiencies of the plurality of light beams are maximized, and obtaining a shape defined by combining the at least two types of optical path difference functions so as to apply the obtained shape to at least one surface of surfaces of the optical element.


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