The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2014
Filed:
May. 24, 2012
Michael Haisch, Aalen, DE;
Christoph Hauger, Aalen, DE;
Harmut Wolf, Oberkochen, DE;
Joachim Hug, Oberkochen, DE;
Brigitta Schwarz, Oberkochen, DE;
Gerhard Gaida, Aalen, DE;
Andreas Raabe, Frankfurt am Main, DE;
Michael Haisch, Aalen, DE;
Christoph Hauger, Aalen, DE;
Harmut Wolf, Oberkochen, DE;
Joachim Hug, Oberkochen, DE;
Brigitta Schwarz, Oberkochen, DE;
Gerhard Gaida, Aalen, DE;
Andreas Raabe, Frankfurt am Main, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
A microscopy system and a microscopy method are provided for observing a fluorescent substance accumulated in a tissue. The microscopy system comprises a filter allowing to observe the tissue at a same time both with visible light and with fluorescent light. It is possible to observe a series of previously recorded fluorescent light images in superposition with the visible light images. An end of the series of images may be automatically determined. A thermal protective filter may be inserted into a beam path of an illuminating system at such automatically determined end of the series.