The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2014

Filed:

Jan. 31, 2012
Applicants:

Nemanya Sedoglavich, Boston, MA (US);

Stuart Buddy Ehrlich, Boston, MA (US);

Emanuel Tito Mendes Machado, Merrimack, NH (US);

Johnathan Charles Sharpe, Hamilton, NZ;

Inventors:

Nemanya Sedoglavich, Boston, MA (US);

Stuart Buddy Ehrlich, Boston, MA (US);

Emanuel Tito Mendes Machado, Merrimack, NH (US);

Johnathan Charles Sharpe, Hamilton, NZ;

Assignee:

Cytonome/ST, LLC, Boston, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A particle analyzing and/or sorting apparatus and the associated methods. One aspect of the described embodiments relates to an analyzer, or a sorter, having acquisition and sort electronics in the form of a field programmable gate array for processing detected signals. Another aspect relates to a droplet based approach of analyzing and sorting particles and may further include a dynamic element, such a dynamic drop delay. In still another broad aspect, an apparatus and method for dynamically varying other sorting parameters.


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