The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2014

Filed:

Oct. 11, 2006
Applicants:

Go Watanabe, Tokyo, JP;

Toshiki Hatori, Tokyo, JP;

Takeshi Kawano, Tokyo, JP;

Ryuuichi Sawada, Tokyo, JP;

Inventors:

Go Watanabe, Tokyo, JP;

Toshiki Hatori, Tokyo, JP;

Takeshi Kawano, Tokyo, JP;

Ryuuichi Sawada, Tokyo, JP;

Assignee:

Kyocera Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
Abstract

An imaging apparatus and an imaging method able to obtain images having no blurring with a small number of images under different exposure conditions and capable of shortening a processing time, wherein an imaging apparatuscaptures a plurality of images including an image having a short exposure time and high resolution, but having much noise and an image having a long exposure time, but having little noise and low resolution by an optical systemand an imaging element. After the signal processing of a signal processing part, a CPUdetects positional deviation among the captured images and blurring, changes the ratio of the plurality of images according to the distances from the edge, and combines these to thereby form an image free from blurring and reducing noise.


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