The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2014
Filed:
Aug. 19, 2010
Applicant:
Fumio Hori, Tokyo, JP;
Inventor:
Fumio Hori, Tokyo, JP;
Assignee:
Olympus Corporation, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
Abstract
An inspection apparatus includes: an insertion portion which is inserted into a device under inspection; a projection unit which projects a striped pattern including a plurality of linear patterns onto an object; an imaging unit which is provided in the insertion portion and images the object onto which the striped pattern is projected and generates image data; a specification unit which specifies an area of interest of the object in an image based on a position of the striped pattern in the image based on the image data; and a measurement unit which measures the area of the object using the image data.