The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2014
Filed:
Jul. 17, 2013
Spinella Ip Holdings, Inc., Colts Neck, NJ (US);
William L. Gaddy, Milford, PA (US);
Vidhya Seran, Irving, TX (US);
Stephen Nowalk, North Huntingdon, PA (US);
Yong Liu, Edison, NJ (US);
Chidambaram Ramanathan, Monmouth Junction, NJ (US);
Spinella IP Holdings, Inc., Colts Neck, NJ (US);
Abstract
A method and system for obtaining a histogram and related statistical values from a data set of texels is disclosed. A processing device receives from a first buffer, a data set of texels. The data set has a dimensionality D of at least two and each texel contains a value. The processing device sorts the data set into a point list of coordinates, wherein a point in the point list corresponds to a texel location in the data set. The processing device reduces the dimensionality of the point list by arranging points in the point list according to an N−1 dimensional dominancy. The processing device performs a raster operation on each associated value of the arranged points to obtain at least one value. The processing device is to output the at least one value to a second buffer. The processing device may be a graphics processing unit.