The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2014

Filed:

Aug. 11, 2009
Applicants:

Evren Ozarslan, Bethesda, MD (US);

Peter J. Basser, Washington, DC (US);

Inventors:

Evren Ozarslan, Bethesda, MD (US);

Peter J. Basser, Washington, DC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/44 (2006.01); A61B 5/05 (2006.01);
U.S. Cl.
CPC ...
Abstract

Using pulsed-field-gradient (PFG) sequences, the sizes of the pores in ordered porous media can be estimated from the 'diffraction' pattern that the signal attenuation curves exhibit. A different diffraction pattern is observed when the experiment is extended to a larger number (N) of diffusion gradient pulse pairs. Differences in the characteristics of attenuation curves also permit distinguishing different pore shapes and distributions using the N-PFG technique. Using an even number of PFG pairs, an approximation to the average pore size can be obtained even when the sample contains pores with a broad distribution of sizes. Multi-PFG sequences can also be used to differentiate free and multi-compartment diffusion, and to estimate compartment sizes and orientations, and to distinguish microscopic and ensemble anisotropy.


Find Patent Forward Citations

Loading…